Lio Y Statistical Quality Technologies Theory and Practice 2019 torrent

Textbook in PDF format

This book explores different statistical quality technologies including recent advances and applications. Statistical process control, acceptance sample plans and reliability assessment are some of the essential statistical techniques in quality technologies to ensure high quality products and to reduce consumer and producer risks. Numerous statistical techniques and methodologies for quality control and improvement have been developed in recent years to help resolve current product quality issues in today’s fast changing environment. Featuring contributions from top experts in the field, this book covers three major topics: statistical process control, acceptance sampling plans, and reliability testing and designs. The topics covered in the book are timely and have a high potential impact and influence to academics, scholars, students and professionals in statistics, engineering, manufacturing and health.
Table of contents
Some Recent Studies in Statistical Process Control
Statistical Quality Control and Reliability Analysis Using the Birnbaum-Saunders Distribution with Industrial Applications
Statistical System Monitoring (SSM) for Enterprise-Level Quality Control
Enhanced Cumulative Sum Charts Based on Ranked Set Sampling
A Survey of Control Charts for Simple Linear Profile Processes with Autocorrelation
Sequential Monitoring of Circular Processes Related to the von Mises Distribution
Time Truncated Life Tests Using the Generalized Multiple Dependent State Sampling Plans for Various Life Distributions
Decision Theoretic Sampling Plan for One-Parameter Exponential Distribution Under Type-I and Type-I Hybrid Censoring Schemes
Economical Sampling Plans with Warranty
Design of Reliability Acceptance Sampling Plans Under Partially Accelerated Life Test
Bayesian Sequential Design Based on Dual Objectives for Accelerated Life Tests
The Stress-Strength Models for the Proportional Hazards Family and Proportional Reverse Hazards Family
A Degradation Model Based on the Wiener Process Assuming Non-Normal Distributed Measurement Errors
An Introduction of Generalized Linear Model Approach to Accelerated Life Test Planning with Type-I Censoring
Robust Design in the Case of Data Contamination and Model Departure
Defects Driven Yield and Reliability Modeling for Semiconductor Manufacturing